Flash Process Report
The Flash Process Review report provides an understanding of a layout of memory cells in the latest flash technologies. This report is a TEM-based analysis focusing on a device’s flash memory cell, and the array peripheral circuitry.
Report contents include the following detailed information:
- Package photographs, package X-ray, die photographs, and selected die features photographs
- SEM cross-sectional and planar analysis of the NAND cell
- TEM cross-sectional and planar analysis of the NAND cell
- Results of TEM-EDS and EELS analysis of the materials
- TEM and SEM cross-sectional analysis of the logic between the memory blocks
- Essential critical dimensions