Process Node Assessment
Chipworks' process node assessment reports provide clients with fundamental but essential device information, such as process design and technology node determined by cross section. The key value of a process node assessment is to get a snapshot of a target device, to help you determine whether further analysis is warranted or not.
Report contents include:
- Brief introduction and process summary
- Table of observed critical dimensions
- Package photographs, package x-ray, and die photograph
- Process analysis including SEM images of the general device structure, minimum metal 1 pitch, and minimum MOS gate length
Although our standard report format provides the essential information for most clients, we provide additional SEM or TEM cross section, package cross section, or photograph of the die delayered to metal 1 or poly if required.
