Functional Analysis
Functional Analysis Report (FAR): Benchmarking insight.
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Chipworks' Functional Analysis Reports focus on a device's floor plan and block level functionality to give you an architectural understanding of the die. This knowledge, in conjunction with basic process information, can then be used as a benchmarking tool to perform a high level cost analysis.
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Report Contents:
- Device memory utilization, capacity, cell architecture and efficiency.
- Overview of the packaging and die - including a die photograph that shows the general structure, along with the number of metal layers and methods of vertical interconnect.
- Minimum observed metal 1 pitch and minimum gate length MOS transistor - to determine the technology generation.
- Annotated deprocessed die photograph to the metal 1 level to show the major functional blocks - along with each block's length, width, area and percent utilization of the die.
- SEM plan view images and summary table for each memory cell, including memory area utilization and logical and actual bit size - and standard logic cell size.
- Optional gate count analysis for specific digital blocks.
Resources and Related Information
Functional Analysis Report Overview