Functional Analysis

Functional Analysis Report (FAR): Benchmarking insight.

Chipworks' Functional Analysis Reports focus on a device's floor plan and block level functionality to give you an architectural understanding of the die. This knowledge, in conjunction with basic process information, can then be used as a benchmarking tool to perform a high level cost analysis.

Report Contents:

• Device memory utilization, capacity, cell architecture and efficiency.
• Overview of the packaging and die - including a die photograph that shows the general structure, along with the number of metal layers and methods of vertical interconnect.
• Minimum observed metal 1 pitch and minimum gate length MOS transistor - to determine the technology generation.
• Annotated deprocessed die photograph to the metal 1 level to show the major functional blocks - along with each block's length, width, area and percent utilization of the die.
• SEM plan view images and summary table for each memory cell, including memory area utilization and logical and actual bit size - and standard logic cell size.
• Optional gate count analysis for specific digital blocks.

Resources and Related Information

  Functional Analysis Report Overview