Patent knowledge. Technology expertise. Market understanding.

Patent knowledge. Technology expertise. Market understanding.

Patent knowledge. Technology expertise. Market understanding.

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Image Sensor Cross-Sectional Analysis

The image sensor cross-sectional analysis provides process details about the pixel design, using 20 to 30 SEM and TEM images. The analysis takes clients from the lens to the pixel transistor gates. It is used by clients to understand the process technology used to fabricate the active region of the device.

These reports contain the following detailed information:

  • Low resolution optical die photograph
  • Low resolution pixel layout at poly showing cross section locations
  • Pixel array edge SEM analysis
  • Pixel cross section SEM from lens to photocathode
  • Pixel cross section SEM of lens and microfilters
  • SEM analysis of metal 0 and floating diffusion
  • SEM analysis of transfer transistors and gate contacts
  • TEM analysis of transfer gate
  • SEM analysis of reset transistor
  • TEM of pixel AR layer
  • TEM of source follower gate
  • SEM of row select transistor
  • SEM analysis of color filters
  • Microlens analysis

 pdf Download a sample report»

 

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