ICWorks Surveyor is designed to make it easier to integrate layout-based reverse engineering analysis into your forward product design workflows, including:
- Seamlessly navigating massive high magnification SEM-based image mosaics of your competitors’ chips
- Accurately measuring key features, using the ruler tool, for use in simulation, costing, and yield estimating
- Viewing multiple metal layers at one time when tracing signals
- Annotating blocks for sharing information within the team and across the organization
It all starts with high quality reverse engineering that effectively decaps and delayers devices cleanly, to enable automated SEM mosiacs of thousands of high magnification images to be taken, and stitched together to calibrated standards.
When used for simulating MEMS devices or for a block level analysis of mixed signal chips, it helps give benchmarking data that you can use for determining where you lead or lag in a competing design. When used for navigating a bevel of an advanced CMOS device it helps you to navigate the logic, routing, and dummy patterns on the device as though you had a SEM on your desktop.
shown: bevel of an Intel 32 nm device